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XRD-D8_Discover

Multi Function High Power X-Ray Diffractometer
Bruker D8 DISCOVER SSS
Location: E1-237
Contact person: Prof. Jinn P. Chu
(TEL:+886-2-27303292 ;E-mail: jpchu@mail.ntust.edu.tw)
Ms. Ying-Ying Wu
(TEL:+886-2-27333141ext 3685 or 7413 ;E-mail: ying22.Wu@mail.ntust.edu.tw)
 
The D8 DISCOVER brings innovative Thin Film Solutions from the forefront of research to quality control, product and process development.
 
Advantages:
Based on the D8 platform with reliable mechanics and ergonomic design the D8 DISCOVER includes a whole set of unique advantages:
• Third generation Göbel Mirrors providing the x-ray highest flux density – essential for all thin film applications.
• The entire system is designed for easy and failsafe operation. Tools like the motorized absorber allow fully automatic operation without user intervention.
• High performance optics are selected and exchanged to provide the optimum resolution for each application and sample.
• Optimal sample handling takes advantage of the new UMC stages as well as different types of Eulerian cradles for e.g. residual stress, texture, micro-diffraction investigations. For x-ray reflectometry on coatings or semiconductors dedicated stages allow even temperature studies.
• Shortest measurement times are achieved using Ultra GID for nanometer layers and the VANTEC-1 detector for reciprocal space maps.
 
Special features
• Goebel Mirror
• Parallel Beam Attachment
• Centric Eulerian Cradle
• Capillary Stage
• Low background Si wafer sample holder
 
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Figure 1. X-Ray Diffractometer of D8 Discover SSS