Location: E1-142

Contact person: Prof. Shih-Yun Chen

(TEL:+886-2-27376517;E-mail: SYChen@mail.ntust.edu.tw)

Ms. Ying-Ying Wu

(TEL:+886-2-27333141ext7413 ;E-mail: ying22.Wu@mail.ntust.edu.tw)

 

Tecnai G2 series combines mature imaging and analysis technologies continuously with novel and advanced capabilities that push the performance of (S)TEM technology and its applications. It features proven advanced optics and techniques which underline FEI’s commitment to furthering (S)TEM some of which include: monochromators for unprecedented high resolution analysis, correctors for advanced performance, special solutions for in-situ and dynamic experiments, advanced spectrum imaging, helium cryo microscopy, 3D imaging and various smart application software solutions. Top level papers printed in leading journals and lectures held at world-wide conferences demonstrate their repeated excellence and proven performance.

 

Imaging

•Patented S-TWIN,objective lenses

•Coma-free alignment for high resolution objective lens centering

•Ranged,rotation-free magnification and diffraction series

•Magnification reproducible within ±1.5%

•Embedded CCD/energy filter

 

Microanlysis

•Excellent EDX in-hole performance(＜1% hole count)

•Low system background in EDX(＜1% spurious peaks)

•High P/B ratio(Fiori number) ＞4000

•Embedding of EDX and energy filter

•Spectrum imaging with multiple detectors

 

STEM

•Fully digital scan system

•Bright Field and Annular Dark Field mode

•High resolution STEM with HAADF detector

 

Speecimen stage

•Fully computer-controlled,eucentric side-entry,high stability CompuStage

•Maximized tilts for any X,Y,Z α and β combination

•Choice of a variety of specimen holders

•X,Y movement ±1mm,Z movement ±0.375mm；specimen size 3mm

•Specimen recall reproducibility：≦0.3μm(after movement of 300μm in x and y)and≦0.1( αtilt)

•Drift≦0.5nm/minute with a standard holder attainable

 

•Operations system:Windows XP

•Xplore 3DTM:FEI’s intelligent tomography solution for TEM and STEM(optional)

•Truelmage:FEI’s patented focal series acquisition and reconstruction software package(optional)

 

Figure 1. Transmission electron microscopy