Location: E1-244

Contact person: Prof. Jem-Kun Chen

(TEL:+886-2-27376544;E-mail: jkchen@mail.ntust.edu.tw)

Ms. Wen-Yuan Wu

(TEL:+886-2-27301126;E-mail:wu099830@mail.ntust.edu.tw)

 

The atomic force microscope can obtained the surficial morphology from the materials in the micron- and nano-scales by its sharp tip (probe).

 

Figure 1. Atomic force microscope